Numerical and Experimental Study of Aging on Electrical Resistance of Copper Connectors with ZrCu Discontinious thin Layer

The demand for electric vehicles is experiencing significant growth, driven by a convergence of environmental, economic, technological, and policy-related factors. With the growing adoption of electric vehicles (EVs), the demand for advanced electrical systems and consequently, a greater number of electrical connectors continues to rise. These connectors are critical to ensuring the safe and reliable operation of EVs, yet their performance can be influenced by environmental factors such as humidity, temperature, and corrosion. This article presents a finite element model of a typical multispot electrical connector featuring ZrCu contact spots, developed using COMSOL Multiphysics. The study simulates contact resistance and conducts an aging analysis by accounting for the increased resistivity of the ZrCu film at the connector interface. Additionally, an experimental investigation was performed by fabricating samples based on the numerical model to measure contact resistance under low-current, low-voltage conditions. The relationship between contact resistance and aging time is subsequently examined, providing valuable insights into the long-term performance of EV electrical connectors.